SMD-3D Profiling System

FEATURE: 3D Profiling
and Inspection


Customer List

Systemic Objective:

The AV650 Semiautomatic Inspection system was developed to insure the repeatability of the inspection process and reduce operator fatigue.  This system uses a fully programmable X, Y stage and variable magnification viewing optics.  The operator is guided through a pre-programmed inspection routine.  As the operator views a die and recognises a defect, the inspection routine is suspended and a defect is logged automatically.  Defect data is stored in a ASCII file for SPC analysis.  Upon completion of the inspection, a wafer map is created.  That data can be used to drive the pick and place operation.

The programmable zoom optics allow the operators to inspect the die at a variety of magnifications.  For instance, a complex inspection pattern can be developed for an individual die, each step in the pattern can have its own pre-programmed magnification.

The AV650 semiautomatic inspection system can accommodate either a single or dual optical system, the dual optics allow the operator to inspect both sides of the die simultaneously.  Dual sided inspection has been used for such applications as LED inspection.  The AV650 semiautomatic system assures the repeatability of the inspection routine and magnifies even the smallest components to a level where defects can be readily seen and classified.

The system is a cost effective inspection tool which can be greatly improve inspection results and help collect the data necessary to meet ISO 9000 standards, as well as facilitate overall improvement.

System Overview:

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